SALEM, M. R.; TALAT, L. A. Failure Dependence Of Semiconductor Devices On Low Temperatures. Al-Mukhtar Journal of Sciences, Albayda, Libya, v. 5, n. 1, p. 43–65, 1998. DOI: 10.54172/mjsc.v5i1.563. Disponível em: https://mdp.omu.edu.ly/journals/index.php/mjsc/article/view/2422. Acesso em: 6 may. 2026.